SVM-Based Routability-Driven Chip-Level Design for Voltage-Aware Pin-Constrained EWOD Chips

Qin Wang, Weiran He, Hailong Yao, Tsung-Yi Ho, Yici Cai. SVM-Based Routability-Driven Chip-Level Design for Voltage-Aware Pin-Constrained EWOD Chips. In Azadeh Davoodi, Evangeline Young, editors, Proceedings of the 2015 Symposium on International Symposium on Physical Design, ISPD 2015, Monterey, CA, USA, March 29 - April 01, 2015. pages 49-56, ACM, 2015. [doi]

Abstract

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