Multilinear codes for robust error detection

Zhen Wang, Mark G. Karpovsky, Berk Sunar. Multilinear codes for robust error detection. In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. pages 164-169, IEEE, 2009. [doi]

Authors

Zhen Wang

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Mark G. Karpovsky

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Berk Sunar

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