Multilinear codes for robust error detection

Zhen Wang, Mark G. Karpovsky, Berk Sunar. Multilinear codes for robust error detection. In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. pages 164-169, IEEE, 2009. [doi]

@inproceedings{WangKS09-0,
  title = {Multilinear codes for robust error detection},
  author = {Zhen Wang and Mark G. Karpovsky and Berk Sunar},
  year = {2009},
  doi = {10.1109/IOLTS.2009.5196002},
  url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5196002},
  researchr = {https://researchr.org/publication/WangKS09-0},
  cites = {0},
  citedby = {0},
  pages = {164-169},
  booktitle = {15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal},
  publisher = {IEEE},
  isbn = {978-1-4244-4596-7},
}