Single Event Resilient Dynamic Logic Designs

H. B. Wang, M. L. Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, R. Fung, J.-S. Bi. Single Event Resilient Dynamic Logic Designs. J. Electronic Testing, 30(6):751-761, 2014. [doi]

Abstract

Abstract is missing.