Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D NAND Flash Memories

Nian-Jia Wang, Kuan-Yi Lee, Hsin-Yi Lin, Wei-Hao Hsiao, Ming-Yi Lee, Li-Kuang Kuo, Ding-Jhang Lin, Yen-Hai Chao, Chih-Yuan Lu. Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D NAND Flash Memories. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]

Abstract

Abstract is missing.