Two-phase fine-grain sleep transistor insertion technique in leakage critical circuits

Yu Wang, Yongpan Liu, Rong Luo, Huazhong Yang, Hui Wang. Two-phase fine-grain sleep transistor insertion technique in leakage critical circuits. In Wolfgang Nebel, Mircea R. Stan, Anand Raghunathan, Jörg Henkel, Diana Marculescu, editors, Proceedings of the 2006 International Symposium on Low Power Electronics and Design, 2006, Tegernsee, Bavaria, Germany, October 4-6, 2006. pages 238-243, ACM, 2006. [doi]

Abstract

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