Jing Wang, Xiang Lu, Wangqi Qiu, Ziding Yue, Steve Fancler, Weiping Shi, D. M. H. Walker. Static Compaction of Delay Tests Considering Power Supply Noise. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 235-240, IEEE Computer Society, 2005. [doi]
Abstract is missing.