Jianmin Wang, Fengqiu Liu, Yuhu Wu. Stuck-at Fault Diagnosis of Four-bit Carry Look-ahead Adder by Shannon Expansion via Semi-tensor Product. In 60th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2021, Tokyo, Japan, September 8-10, 2021. pages 933-938, IEEE, 2021. [doi]
@inproceedings{WangLW21-10, title = {Stuck-at Fault Diagnosis of Four-bit Carry Look-ahead Adder by Shannon Expansion via Semi-tensor Product}, author = {Jianmin Wang and Fengqiu Liu and Yuhu Wu}, year = {2021}, url = {https://ieeexplore.ieee.org/document/9555361}, researchr = {https://researchr.org/publication/WangLW21-10}, cites = {0}, citedby = {0}, pages = {933-938}, booktitle = {60th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2021, Tokyo, Japan, September 8-10, 2021}, publisher = {IEEE}, isbn = {978-4-9077-6473-9}, }