Jianmin Wang, Fengqiu Liu, Yuhu Wu. Stuck-at Fault Diagnosis of Four-bit Carry Look-ahead Adder by Shannon Expansion via Semi-tensor Product. In 60th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2021, Tokyo, Japan, September 8-10, 2021. pages 933-938, IEEE, 2021. [doi]
Abstract is missing.