Insulator Defect Recognition Based on Faster R-CNN

Yifan Wang, Zhongxu Li, Xuecheng Yang, Ning Luo, Yu Zhao, Gang Zhou. Insulator Defect Recognition Based on Faster R-CNN. In Mohammad S. Obaidat, Kuei-Fang Hsiao, Petros Nicopolitidis, Daniel Cascado Caballero, editors, International Conference on Computer, Information and Telecommunication Systems, CITS 2020, Hangzhou, China, October 5-7, 2020. pages 1-4, IEEE, 2020. [doi]

Authors

Yifan Wang

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Zhongxu Li

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Xuecheng Yang

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Ning Luo

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Yu Zhao

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Gang Zhou

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