Yifan Wang, Zhongxu Li, Xuecheng Yang, Ning Luo, Yu Zhao, Gang Zhou. Insulator Defect Recognition Based on Faster R-CNN. In Mohammad S. Obaidat, Kuei-Fang Hsiao, Petros Nicopolitidis, Daniel Cascado Caballero, editors, International Conference on Computer, Information and Telecommunication Systems, CITS 2020, Hangzhou, China, October 5-7, 2020. pages 1-4, IEEE, 2020. [doi]
@inproceedings{WangLYLZZ20,
title = {Insulator Defect Recognition Based on Faster R-CNN},
author = {Yifan Wang and Zhongxu Li and Xuecheng Yang and Ning Luo and Yu Zhao and Gang Zhou},
year = {2020},
doi = {10.1109/CITS49457.2020.9232614},
url = {https://doi.org/10.1109/CITS49457.2020.9232614},
researchr = {https://researchr.org/publication/WangLYLZZ20},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {International Conference on Computer, Information and Telecommunication Systems, CITS 2020, Hangzhou, China, October 5-7, 2020},
editor = {Mohammad S. Obaidat and Kuei-Fang Hsiao and Petros Nicopolitidis and Daniel Cascado Caballero},
publisher = {IEEE},
isbn = {978-1-7281-6544-8},
}