Yifan Wang, Zhongxu Li, Xuecheng Yang, Ning Luo, Yu Zhao, Gang Zhou. Insulator Defect Recognition Based on Faster R-CNN. In Mohammad S. Obaidat, Kuei-Fang Hsiao, Petros Nicopolitidis, Daniel Cascado Caballero, editors, International Conference on Computer, Information and Telecommunication Systems, CITS 2020, Hangzhou, China, October 5-7, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.