A physical model of electron trapping/detrapping in electrically stressed oxide

Hongyi Wang, Cong Li, Bingbing Zhang, Shunqiang Xu, Liming Zheng, Jianfei Wu. A physical model of electron trapping/detrapping in electrically stressed oxide. IEICE Electronic Express, 14(16):20170565, 2017. [doi]

Abstract

Abstract is missing.