Circuits for Pseudo-Exhaustive Test Pattern Generation

Laung-Terng Wang, Edward J. McCluskey. Circuits for Pseudo-Exhaustive Test Pattern Generation. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 25-37, IEEE Computer Society, 1986.

Authors

Laung-Terng Wang

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Edward J. McCluskey

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