Laung-Terng Wang, Edward J. McCluskey. Circuits for Pseudo-Exhaustive Test Pattern Generation. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 25-37, IEEE Computer Society, 1986.
@inproceedings{WangM86,
title = {Circuits for Pseudo-Exhaustive Test Pattern Generation},
author = {Laung-Terng Wang and Edward J. McCluskey},
year = {1986},
tags = {testing},
researchr = {https://researchr.org/publication/WangM86},
cites = {0},
citedby = {0},
pages = {25-37},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
publisher = {IEEE Computer Society},
}