Xiaoyi Wang, Shaobin Ma, Sheldon X.-D. Tan, Chase Cook, Liang Chen, Jianlei Yang 0001, Wenjian Yu. Fast Physics-Based Electromigration Analysis for Full-Chip Networks by Efficient Eigenfunction-Based Solution. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(3):507-520, 2021. [doi]
Abstract is missing.