Multiple Fault Diagnosis Using n-Detection Tests

Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski. Multiple Fault Diagnosis Using n-Detection Tests. In 21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings. pages 198, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.