Analysis and methodology for multiple-fault diagnosis

Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski. Analysis and methodology for multiple-fault diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(3):558-575, 2006. [doi]

Authors

Zhiyuan Wang

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Malgorzata Marek-Sadowska

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Kun-Han Tsai

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Janusz Rajski

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