Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski. Analysis and methodology for multiple-fault diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(3):558-575, 2006. [doi]
@article{WangMTR06,
title = {Analysis and methodology for multiple-fault diagnosis},
author = {Zhiyuan Wang and Malgorzata Marek-Sadowska and Kun-Han Tsai and Janusz Rajski},
year = {2006},
doi = {10.1109/TCAD.2005.854624},
url = {http://dx.doi.org/10.1109/TCAD.2005.854624},
tags = {analysis},
researchr = {https://researchr.org/publication/WangMTR06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {3},
pages = {558-575},
}