Scalable behavior modeling for SCR based ESD protection structures for circuit simulation

Li Wang, Rui Ma, Chen Zhang, Zongyu Dong, Fei Lu, Albert Wang, Xin Wang, Jian Liu, Siqiang Fan, He Tang, Baoyong Chi, Liji Wu, T. L. Ren. Scalable behavior modeling for SCR based ESD protection structures for circuit simulation. In IEEE International Symposium on Circuits and Systemss, ISCAS 2014, Melbourne, Victoria, Australia, June 1-5, 2014. pages 2333-2336, IEEE, 2014. [doi]

Abstract

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