A CMOS IR-UWB Transceiver Design for Contact-Less Chip Testing Applications

Yanjie Wang, Ali M. Niknejad, Vincent C. Gaudet, Kris Iniewski. A CMOS IR-UWB Transceiver Design for Contact-Less Chip Testing Applications. IEEE Trans. on Circuits and Systems, 55-II(4):334-338, 2008. [doi]

Authors

Yanjie Wang

This author has not been identified. Look up 'Yanjie Wang' in Google

Ali M. Niknejad

This author has not been identified. Look up 'Ali M. Niknejad' in Google

Vincent C. Gaudet

This author has not been identified. Look up 'Vincent C. Gaudet' in Google

Kris Iniewski

This author has not been identified. Look up 'Kris Iniewski' in Google