A CMOS IR-UWB Transceiver Design for Contact-Less Chip Testing Applications

Yanjie Wang, Ali M. Niknejad, Vincent C. Gaudet, Kris Iniewski. A CMOS IR-UWB Transceiver Design for Contact-Less Chip Testing Applications. IEEE Trans. on Circuits and Systems, 55-II(4):334-338, 2008. [doi]

Abstract

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