Yanjie Wang, Ali M. Niknejad, Vincent C. Gaudet, Kris Iniewski. A CMOS IR-UWB Transceiver Design for Contact-Less Chip Testing Applications. IEEE Trans. on Circuits and Systems, 55-II(4):334-338, 2008. [doi]
@article{WangNGI08,
title = {A CMOS IR-UWB Transceiver Design for Contact-Less Chip Testing Applications},
author = {Yanjie Wang and Ali M. Niknejad and Vincent C. Gaudet and Kris Iniewski},
year = {2008},
doi = {10.1109/TCSII.2008.919502},
url = {http://dx.doi.org/10.1109/TCSII.2008.919502},
researchr = {https://researchr.org/publication/WangNGI08},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {55-II},
number = {4},
pages = {334-338},
}