Xinmu Wang, Seetharam Narasimhan, Aswin Raghav Krishna, Swarup Bhunia. SCARE: Side-Channel Analysis Based Reverse Engineering for Post-Silicon Validation. In Vishwani D. Agrawal, Srimat T. Chakradhar, editors, 25th International Conference on VLSI Design, VLSID 2012, Hyderabad, India, January 7-11, 2012. pages 304-309, IEEE, 2012. [doi]
Abstract is missing.