Xiaopeng Wang, Marco Ottavi, Fabrizio Lombardi. Yield Analysis of Compiler-Based Arrays of Embedded SRAMs. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 3-10, IEEE Computer Society, 2003. [doi]
@inproceedings{WangOL03,
title = {Yield Analysis of Compiler-Based Arrays of Embedded SRAMs},
author = {Xiaopeng Wang and Marco Ottavi and Fabrizio Lombardi},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/dft/2003/2042/00/20420003abs.htm},
tags = {rule-based, analysis, compiler},
researchr = {https://researchr.org/publication/WangOL03},
cites = {0},
citedby = {0},
pages = {3-10},
booktitle = {18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2042-1},
}