Xiaopeng Wang, Marco Ottavi, Fabrizio Lombardi. Yield Analysis of Compiler-Based Arrays of Embedded SRAMs. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 3-10, IEEE Computer Society, 2003. [doi]
Abstract is missing.