Zhi Wang, Christopher Pannier, Lauro Ojeda, Kira Barton, David J. Hoelzle. An application of spatial Iterative Learning Control to micro-additive manufacturing. In 2016 American Control Conference, ACC 2016, Boston, MA, USA, July 6-8, 2016. pages 354-359, IEEE, 2016. [doi]
Abstract is missing.