Baosheng Wang, Jayalakshmi Rajaraman, Kanwaldeep Sobti, Derrick Losli, Jeff Rearick. Structural tests of slave clock gating in low-power flip-flop. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 254-259, IEEE Computer Society, 2011. [doi]
Abstract is missing.