Leveraging recovery effect to reduce electromigration degradation in power/ground TSV

Shengcheng Wang, Zeyu Sun, Yuan Cheng, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori. Leveraging recovery effect to reduce electromigration degradation in power/ground TSV. In 2017 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2017, Irvine, CA, USA, November 13-16, 2017. pages 811-818, IEEE, 2017. [doi]

Abstract

Abstract is missing.