Wendong Wang, Adit D. Singh, Ujjwal Guin, Abhijit Chatterjee. Exploiting power supply ramp rate for calibrating cell strength in SRAM PUFs. In 19th IEEE Latin-American Test Symposium, LATS 2018, Sao Paulo, Brazil, March 12-14, 2018. pages 1-6, IEEE, 2018. [doi]
Abstract is missing.