A Novel Entropy Production Based Full-Chip TSV Fatigue Analysis

Tianchen Wang, Sandeep Kumar Samal, Sung Kyu Lim, Yiyu Shi. A Novel Entropy Production Based Full-Chip TSV Fatigue Analysis. In Diana Marculescu, Frank Liu, editors, Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015, Austin, TX, USA, November 2-6, 2015. pages 744-751, ACM, 2015. [doi]

Abstract

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