Senling Wang, Yasuo Sato, Kohei Miyase, Seiji Kajihara. A Scan-Out Power Reduction Method for Multi-cycle BIST. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 272-277, IEEE Computer Society, 2012. [doi]
@inproceedings{WangSMK12,
title = {A Scan-Out Power Reduction Method for Multi-cycle BIST},
author = {Senling Wang and Yasuo Sato and Kohei Miyase and Seiji Kajihara},
year = {2012},
doi = {10.1109/ATS.2012.50},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2012.50},
researchr = {https://researchr.org/publication/WangSMK12},
cites = {0},
citedby = {0},
pages = {272-277},
booktitle = {21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-4555-2},
}