Senling Wang, Yasuo Sato, Kohei Miyase, Seiji Kajihara. A Scan-Out Power Reduction Method for Multi-cycle BIST. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 272-277, IEEE Computer Society, 2012. [doi]
Abstract is missing.