Danwei Wang, Jeevanand Seshadrinath, Viet Hung Nguyen, Abhisek Ukil, Viswanathan Vaiyapuri, Sivakumar Nadarajan, M. Siva Rama Krishna. A multiple indicator approach for FDI of inter-turn fault in induction machines. In IEEE International Conference on Industrial Technology, ICIT 2016, Taipei, Taiwan, March 14-17, 2016. pages 128-133, IEEE, 2016. [doi]
@inproceedings{WangSNUVNK16,
title = {A multiple indicator approach for FDI of inter-turn fault in induction machines},
author = {Danwei Wang and Jeevanand Seshadrinath and Viet Hung Nguyen and Abhisek Ukil and Viswanathan Vaiyapuri and Sivakumar Nadarajan and M. Siva Rama Krishna},
year = {2016},
doi = {10.1109/ICIT.2016.7474738},
url = {https://doi.org/10.1109/ICIT.2016.7474738},
researchr = {https://researchr.org/publication/WangSNUVNK16},
cites = {0},
citedby = {0},
pages = {128-133},
booktitle = {IEEE International Conference on Industrial Technology, ICIT 2016, Taipei, Taiwan, March 14-17, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8075-1},
}