Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg. Some considerations on choosing an outlier method for automotive product lines. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]
Abstract is missing.