Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Xiaofei Wang, Qianying Tang, Pulkit Jain, Dong Jiao, Chris H. Kim. The Dependence of BTI and HCI-Induced Frequency Degradation on Interconnect Length and Its Circuit Level Implications. IEEE Trans. VLSI Syst., 23(2):280-291, 2015. [doi]