The Dependence of BTI and HCI-Induced Frequency Degradation on Interconnect Length and Its Circuit Level Implications - researchr publication

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Xiaofei Wang, Qianying Tang, Pulkit Jain, Dong Jiao, Chris H. Kim. The Dependence of BTI and HCI-Induced Frequency Degradation on Interconnect Length and Its Circuit Level Implications. IEEE Trans. VLSI Syst., 23(2):280-291, 2015. [doi]

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