Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns - researchr publication authors

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Seongmoon Wang, Wenlong Wei. Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 125-130, IEEE Computer Society, 2008. [doi]

This author has not been identified. Look up 'Seongmoon Wang' in GoogleThis author has not been identified. Look up 'Wenlong Wei' in Google

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