Seongmoon Wang, Wenlong Wei. Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 125-130, IEEE Computer Society, 2008. [doi]
@inproceedings{WangW08-6,
title = {Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns},
author = {Seongmoon Wang and Wenlong Wei},
year = {2008},
doi = {10.1109/ETS.2008.12},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2008.12},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/WangW08-6},
cites = {0},
citedby = {0},
pages = {125-130},
booktitle = {13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3150-2},
}