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Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns

Seongmoon Wang, Wenlong Wei. Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. In 13th European Test Symposium (ETS 2008), May 25-29, 2008, Verbania, Italy. pages 125-130, IEEE Computer Society, 2008. [doi]

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