Zheng Wang, Duncan M. Hank Walker. Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 59-64, IEEE Computer Society, 2009. [doi]
@inproceedings{WangW09-45,
title = {Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric},
author = {Zheng Wang and Duncan M. Hank Walker},
year = {2009},
doi = {10.1109/VTS.2009.55},
url = {http://dx.doi.org/10.1109/VTS.2009.55},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/WangW09-45},
cites = {0},
citedby = {0},
pages = {59-64},
booktitle = {27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3598-2},
}