Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Zheng Wang, Duncan M. Hank Walker. Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 59-64, IEEE Computer Society, 2009. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test PatternsSeongmoon Wang, Wenlong Wei. ets 2008: 125-130 [doi] Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test SetsSeongmoon Wang, Xiao Liu, Srimat T. Chakradhar. date 2004: 1296-1301 [doi] A Statistical Fault Coverage Metric for Realistic Path Delay FaultsWangqi Qiu, Xiang Lu, Jing Wang, Zhuo Li, D. M. H. Walker, Weiping Shi. vts 2004: 37-42 [doi]
The following publications are possibly variants of this publication: