Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar. A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 79-86, IEEE, 2007. [doi]
@inproceedings{WangWC07-2,
title = {A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding},
author = {Seongmoon Wang and Wenlong Wei and Srimat T. Chakradhar},
year = {2007},
doi = {10.1109/ATS.2007.52},
url = {https://doi.org/10.1109/ATS.2007.52},
researchr = {https://researchr.org/publication/WangWC07-2},
cites = {0},
citedby = {0},
pages = {79-86},
booktitle = {16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007},
publisher = {IEEE},
isbn = {978-0-7695-2890-8},
}