The following publications are possibly variants of this publication:
- A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test CompressionZhanglei Wang, Krishnendu Chakrabarty, Michael Bienek. emnets 2007: 125-130 [doi]
- Test Data Compression with Partial LFSR-ReseedingYu-Hsuan Fu, Sying-Jyan Wang. ats 2005: 343-347 [doi]
- Deviation-Based LFSR Reseeding for Test-Data CompressionZhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek. tcad, 28(2):259-271, 2009. [doi]
- LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan DesignsHaiying Yuan, Changshi Zhou, Xun Sun, Kai Zhang, Tong Zheng, Chang Liu, Xiuyu Wang. et, 34(6):685-695, 2018. [doi]