LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs

Haiying Yuan, Changshi Zhou, Xun Sun, Kai Zhang, Tong Zheng, Chang Liu, Xiuyu Wang. LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs. J. Electronic Testing, 34(6):685-695, 2018. [doi]

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