Haiying Yuan, Changshi Zhou, Xun Sun, Kai Zhang, Tong Zheng, Chang Liu, Xiuyu Wang. LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs. J. Electronic Testing, 34(6):685-695, 2018. [doi]
@article{YuanZSZZLW18,
title = {LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs},
author = {Haiying Yuan and Changshi Zhou and Xun Sun and Kai Zhang and Tong Zheng and Chang Liu and Xiuyu Wang},
year = {2018},
doi = {10.1007/s10836-018-5756-3},
url = {https://doi.org/10.1007/s10836-018-5756-3},
researchr = {https://researchr.org/publication/YuanZSZZLW18},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {34},
number = {6},
pages = {685-695},
}