Simplification of sub-gap density of states extraction method for amorphous In-Ga-Zn-O thin-film transistors by a single capacitance-voltage curve

Weiliang Wang, Pengjun Wang, Mingzhi Dai. Simplification of sub-gap density of states extraction method for amorphous In-Ga-Zn-O thin-film transistors by a single capacitance-voltage curve. Microelectronics Reliability, 83:111-114, 2018. [doi]

Authors

Weiliang Wang

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Pengjun Wang

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Mingzhi Dai

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