Simplification of sub-gap density of states extraction method for amorphous In-Ga-Zn-O thin-film transistors by a single capacitance-voltage curve

Weiliang Wang, Pengjun Wang, Mingzhi Dai. Simplification of sub-gap density of states extraction method for amorphous In-Ga-Zn-O thin-film transistors by a single capacitance-voltage curve. Microelectronics Reliability, 83:111-114, 2018. [doi]

Abstract

Abstract is missing.