Weiliang Wang, Pengjun Wang, Mingzhi Dai. Simplification of sub-gap density of states extraction method for amorphous In-Ga-Zn-O thin-film transistors by a single capacitance-voltage curve. Microelectronics Reliability, 83:111-114, 2018. [doi]
@article{WangWD18-0,
title = {Simplification of sub-gap density of states extraction method for amorphous In-Ga-Zn-O thin-film transistors by a single capacitance-voltage curve},
author = {Weiliang Wang and Pengjun Wang and Mingzhi Dai},
year = {2018},
doi = {10.1016/j.microrel.2018.01.007},
url = {https://doi.org/10.1016/j.microrel.2018.01.007},
researchr = {https://researchr.org/publication/WangWD18-0},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {83},
pages = {111-114},
}