Physics-based electromigration modeling and assessment for multi-segment interconnects in power grid networks

Xiaoyi Wang, Hongyu Wang, Jian He, Sheldon X.-D. Tan, Yici Cai, Shengqi Yang. Physics-based electromigration modeling and assessment for multi-segment interconnects in power grid networks. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1727-1732, IEEE, 2017. [doi]

Abstract

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